Тома/выпуски/составные части: Microelectronics and reliability

Значок книги

Microelectronics and reliability: an international journal

Вид документа:	Периодические издания
Опубликовано:	Oxford [etc.] : Pergamon Press, 1964―
Язык:	Английский
Предмет:	МИКРОЭЛЕКТРОННЫЕ ПРИБОРЫ МІКРАЭЛЕКТРОННЫЯ ПРЫБОРЫ МИКРОЭЛЕКТРОНИКА МІКРАЭЛЕКТРОНІКА НАДЕЖНОСТЬ (техн.) НАДЗЕЙНАСЦЬ (тэхн.) МИКРОЭЛЕКТРОННЫЕ СИСТЕМЫ МІКРАЭЛЕКТРОННЫЯ СІСТЭМЫ

Advances in microelectronics : review papers from the 12th Yugoslav Conference on Microelectronics, Yugoslavia, 7―9 May 1984 / guest editor: N. D. Stojadinović. — [S. l. : s. n., 1984]. — С. [4], 201―366. — (Microelectronics and reliability ; vol. 24, № 2)

European integrated circuit reliability : [collected papers]. — [S. l. : s. n., 1983]. — С. [4], 607―765. — (Microelectronics and reliability ; vol. 23, № 4)

Petri nets and related graph models / guest editor: Gurdeep Singh Hura. — [S. l. : s. n., 1991]. — С. [4], 559―815. — (Microelectronics and reliability ; vol. 31, № 4)

RAM-cost analysis and modelling : (economics of reliability, availability and maintainability based system design) / guest editor: Celestine A. Ntuen. — [S. l. : s. n., 1989]. — [4], 80 с. — (Microelectronics and reliability ; vol. 29, № 1)

Reliability in electronics : selected proceedings of the seventh Symposium on reliability in electronics (Relectronic '88), Budapest, Hungary, 29 August ― 2 September 1988 / guest editor: A. Balogh. — [S. l. : s. n., 1989]. — С. [4], 297―458. — (Microelectronics and reliability ; vol. 29, № 3)

Semiconductor and microprocessor technology 1979 : selected papers presented at the 1979 annual Seminex technical seminar and exhibition, London, England. — [S. l. : s. n., 1979]. — С. III, 407―644. — (Microelectronics and reliability ; vol. 19, № 5/6)

Semiconductor and microprocessor technology 1980 : selected papers presented at the 1980 annual Seminex technical seminar and exhibition, London, England. — [S. l. : s. n., 1981]. — С. [4], 293―477. — (Microelectronics and reliability ; vol. 21, № 3)

Semiconductor and microprocessor technology 1981 : selected papers presented at the 1981 annual Seminex technical seminar and exhibition, London, England. — [S. l. : s. n., 1981]. — С. [4], 767―900. — (Microelectronics and reliability ; vol. 21, № 6)

Semiconductor technology 1976 : selected papers presented at the 1976 annual Seminex technical seminar and exhibition, London, England. — [S. l. : s. n., 1976]. — С. III, 249―353. — (Microelectronics and reliability ; vol. 15, № 4)

Semiconductor technology 1977 : selected papers presented at the 1977 annual Seminex technical seminar and exhibition, London, England. — [S. l. : s. n., 1977]. — С. III, 273―526. — (Microelectronics and reliability ; vol. 16, № 4)

Special Seminex 1974 issue. — [S. l. : s. n., 1974]. — С. 309―432. — (Microelectronics and reliability ; vol. 13, № 5)

The 1975 Canadian SRE reliability symposium, Saturday May 10, 1975, Ottawa, Ontario, Canada : proceedings. — [S. l. : s. n., 1975]. — С. [6], 73―237. — (Microelectronics and reliability ; vol. 14, № 2)

The 1977 Canadian SRE reliability symposium, Thursday & Friday October 13―14, 1977, Ottawa, Ontario, Canada : proceedings. — [S. l. : s. n., 1978]. — VIII, 234 с. — (Microelectronics and reliability ; vol. 17, № 1)

The 1978 Canadian reliability symposium, October 19―20, 1978, Ottawa, Ontario, Canada : proceedings. — [S. l. : s. n., 1979]. — VIII, 168 с. — (Microelectronics and reliability ; vol. 19, № 1/2)

The 1980 Canadian reliability symposium, May 16―17, 1980, Toronto, Ontario, Canada : proceedings. — [S. l. : s. n., 1980]. — V, 160 с. — (Microelectronics and reliability ; vol. 20, № 1/2)